Jeol

Jeol JSM 7900F FE-SEM

The field emission scanning electron microscope (FE-SEM) is an ultra-high-resolution materials characterization equipment that can be used for effective viewing and analyzing of the microstructural components of materials down to the nanoscale dimensions. The attached in-situ multiscale materials testing systems on the FESEM enables the simultaneous assessment of the correlations between the microstructural make-up of materials and their corresponding mechanical behavior under various kinds of tensile loading conditions.

Contact Person/s

Name: PROF PETER APATA OLUBAMBI
Phone: +27 11-559-6625
Mobile: +27 79-163-2906
Email: polubambi@uj.ac.za

Grantholder

Title: Prof
First Name: PETER
Last Name: OLUBAMBI
Phone: +27 11-559-6625
Email: polubambi@uj.ac.za
Jeol JSM 7900F FE-SEM

Jeol 733 Super-probe

The JEOL 733 Superprobe combines four wavelength dispersive spectrometers (WDS) and one energy dispersive spectrometer (EDS) with scanning electron microscope (SEM) capabilities to create an extremely powerful, yet easily accessible, micro-analytical instrument.

Contact Person/s

Name: Dr Gelu Costin
Email: costin@ru.ac.za
Jeol 733 Super-probe

Jeol 1210 Electron Microscope Electron Microscopes

The JEOL 1210 is a conventional transmission electron microscope which is optimized for high contrast imaging at low to moderate magnifications (<100,000X). This instrument is most commonly used to image thin (<200nm) samples of polymers and frozen hydrated solutions (surfactants, colloids, emulsions). This microscope is also used to train users new to TEM. It has a maximum operating voltage of 120 kV. It is capable of Imaging in high-magnification (>1,000X) and low magnification and diffraction modes.

Contact Person/s

Name: Shirley Pinchuck
Phone: +27 46-603-8169
Email: s.pinchuck@ru.ac.za
Jeol 1210 Electron Microscope Electron Microscopes

Jeol JXA-8230 Electron Probe Micro-Analyzer (EPMA)

Electron Microprobes have been widely used for over 40 years for non-destructive, quantitative, elemental microanalysis of solid materials. They are the instrument of choice for quantitative elemental analyses of solid particles including major, minor and trace elements.

Contact Person/s

Name: Dr Gelu Costin
Phone: +27 46-603-8316
Email: g.costin@ru.ac.za

Grantholder

Title: Prof
First Name: JS
Last Name: Marsh
Phone: +27 46-603-8312
Email: goonie.marsh@ru.ac.za
Jeol JXA-8230 Electron Probe Micro-Analyzer (EPMA)

Jeol CP II Cross Section Polisher

The Cross Section Polisher uses an Argon Ion Beam to prepare cross sections of materials for characterization by Scanning Electron Microscopy. The method is useful for the observation of layered structures, interfaces and the microstructure of metals, ceramics semiconductor devices and composites. It is important in the case of difficult-to-polish soft materials and difficult-to-cut hard materials.

Contact Person/s

Name: Prof JH Neethling
Phone: +27 41-504-2143
Email: jan.neethling@nmmu.ac.za

Grantholder

Title: Prof
First Name: JH
Last Name: Neethling
Phone: +27 41-504-2143
Email: jan.neethling@nmmu.ac.za
Jeol CP II Cross Section Polisher

Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope

JEOL ARM200F double aberration corrected high resolution transmission electron microscope (HRTEM) with field emission gun (FEG), and energy dispersive X-ray spectrometry system (EDS), scanning transmission electron microscopy (STEM) attachment, high angle annular dark-field STEM detector (

Contact Person/s

Name: Prof JH Neethling
Phone: +27 41-504-2143
Email: jan.neethling@nmmu.ac.za

Grantholder

Title: Prof
First Name: JH
Last Name: Neethling
Phone: +27 41-504-2143
Email: jan.neethling@nmmu.ac.za
Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope

Jeol 840A Scanning Electron Microscope (SEM)

The JEOL 840A is a medium resolution scanning electron microscope used for conventional microstructure analyses. The instrument is designed for the analysis focusing on the physical and chemical microstructure of solid state materials allowing spatially resolved compositional analysis by an EDAX Genesis 200 X-ray emission spectroscopy system.

Contact Person/s

Name: Deshenthree Chetty
Phone: +27 11-709-4523
Email: Deshc@mintek.co.za
Jeol 840A Scanning Electron Microscope (SEM)

Jeol JSM 7600F Field Emission Gun Ultra-High Resolution Scanning Electron Microscope Electron Microscopes

The JSM-7600F is a state of-the-art thermal field emission gun scanning electron microscope. It successfully combines ultra-high resolution imaging with optimized analytical functionality. It incorporates a large specimen chamber. The microscope integrates a semi in-lens system for high resolution imaging, and an in-lens thermal electron gun, both of which are a culmination of JEOL's expertise in imaging and analysis. Its new User Interface enables easy navigation through imaging and analyzing procedures.

Contact Person/s

Name: Dr PA Olubambi
Phone: +27 12-382-3598
Email: olubambipa@tut.ac.za

Grantholder

Title: Dr
First Name: PA
Last Name: Olubambi
Phone: +27 12-382-3598
Email: olubambipa@tut.ac.za
Jeol JSM 7600F Field Emission Gun Ultra-High Resolution Scanning Electron Microscope Electron Microscopes

Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes

The JSM-6390LV is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm. The customizable GUI interface allows the instrument to be intuitively operated, and Smile Shot™ software ensures optimum operation settings.

Contact Person/s

Name: Prof AJ Afolayan
Phone: +27 40-602-2323
Email: aafolayan@ufh.ac.za

Grantholder

Title: Prof
First Name: AJ
Last Name: Afolayan
Phone: +27 40-602-2323
Email: aafolayan@ufh.ac.za
Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes