The JSM-7600F is a state of-the-art thermal field emission gun scanning electron microscope. It successfully combines ultra-high resolution imaging with optimized analytical functionality. It incorporates a large specimen chamber. The microscope integrates a semi in-lens system for high resolution imaging, and an in-lens thermal electron gun, both of which are a culmination of JEOL's expertise in imaging and analysis. Its new User Interface enables easy navigation through imaging and analyzing procedures.
Microscope - Electron Microscopes - Scanning Electron Microscope (SEM)