Jeol JSM 7600F Field Emission Gun Ultra-High Resolution Scanning Electron Microscope Electron Microscopes

Model: 
JSM 7600F Field Emission Gun Ultra-High Resolution Scanning Electron Microscope
Manufacturer: 
Jeol
Supplier: 
Advanced Laboratory Solutions
Jeol JSM 7600F Field Emission Gun Ultra-High Resolution Scanning Electron Microscope Electron Microscopes

The JSM-7600F is a state of-the-art thermal field emission gun scanning electron microscope. It successfully combines ultra-high resolution imaging with optimized analytical functionality. It incorporates a large specimen chamber. The microscope integrates a semi in-lens system for high resolution imaging, and an in-lens thermal electron gun, both of which are a culmination of JEOL's expertise in imaging and analysis. Its new User Interface enables easy navigation through imaging and analyzing procedures.

Condition: 
New
Category: 
Microscope - Electron Microscopes - Scanning Electron Microscope (SEM)
Disciplines: 
Engineering
Life Expectancy: 
15years
Location
Faculty: 
Engineering
Department: 
Chemical and Metallurgical Engineering
Building: 
Room 02 A, Ground Floor, Building 1
Tshwane University of Technology
Staatsartillerie Road
Pretoria
0002

Contact Person/s

Name: Dr PA Olubambi
Phone: +27 12-382-3598
Email: olubambipa@tut.ac.za
Estimated Cost and Availability
Internal: 
R300
Per Hour
External: 
R400
Per Hour
Private Sector: 
R600
Per Hour

Grantholder

Title: Dr
First Name: PA
Last Name: Olubambi
Phone: +27 12-382-3598
Email: olubambipa@tut.ac.za
Funding Information
Year of Acquisition: 
2011