Advanced Laboratory Solutions

Jeol JSM 7900F FE-SEM

Jeol JSM 7900F FE-SEM

The field emission scanning electron microscope (FE-SEM) is an ultra-high-resolution materials characterization equipment that can be used for effe

Institution: 
University of Johannesburg
Microscope

Silicon Drift Energy dispersive X-ray spectrometer Oxford XMax 100TLE Energy Dispersive X-ray Spectrometer

The XMax SDD EDS detector is attached to the atomic resolution HRTEM (Jeol ARM 200F).

Institution: 
Nelson Mandela Metropolitan University
SpectrometersEnergy Dispersive X-ray Spectrometer

Calorimeter TAMIII

All chemical, physical and biological processes result in either heat production or heat consumption.

Institution: 
Nelson Mandela Metropolitan University
Calorimeter
High resolution sputter coater and carbon evaporator Q150T ES Modula coating unit Sputter Coater

High resolution sputter coater and carbon evaporator Q150T ES Modula coating unit Sputter Coater

Quorum Technologies Q150T ES High resolution turbomolecular pumped sputter coater.

Institution: 
Sefako Makgato Health Sciences University
OtherSputter Coater
Jeol JXA-8230 Electron Probe Micro-Analyzer (EPMA)

Jeol JXA-8230 Electron Probe Micro-Analyzer (EPMA)

Electron Microprobes have been widely used for over 40 years for non-destructive, quantitative, elemental microanalysis of solid materials.

Institution: 
Rhodes University
Other
Joel 2100F Transmission Electron Microscope (TEM)

Joel 2100F Transmission Electron Microscope (TEM)

The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultra-h

Institution: 
Mintek
Microscope
Jeol 840A Scanning Electron Microscope (SEM)

Jeol 840A Scanning Electron Microscope (SEM)

The JEOL 840A is a medium resol

Institution: 
Mintek
Microscope
Jeol JSM 7600F Field Emission Gun Ultra-High Resolution Scanning Electron Microscope Electron Microscopes

Jeol JSM 7600F Field Emission Gun Ultra-High Resolution Scanning Electron Microscope Electron Microscopes

The JSM-7600F is a state of-the-art thermal field emission gun scanning electron microscope.

Institution: 
Tshwane University of Technology
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
CETR UMT 2EC Tribocorrosion Testing System

CETR UMT 2EC Tribocorrosion Testing System

The Tribocorrosion tester is an instrument that allows simultaneous measurement of the tribological and electrochemical characterizations of materi

Institution: 
Tshwane University of Technology
Other
Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes

Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes

The JSM-6390LV is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm.

Institution: 
University of Fort Hare
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)