Advanced Laboratory Solutions
Jeol JSM 7900F FE-SEM
The field emission scanning electron microscope (FE-SEM) is an ultra-high-resolution materials characterization equipment that can be used for effe
Silicon Drift Energy dispersive X-ray spectrometer Oxford XMax 100TLE Energy Dispersive X-ray Spectrometer
The XMax SDD EDS detector is attached to the atomic resolution HRTEM (Jeol ARM 200F).
Calorimeter TAMIII
All chemical, physical and biological processes result in either heat production or heat consumption.
High resolution sputter coater and carbon evaporator Q150T ES Modula coating unit Sputter Coater
Quorum Technologies Q150T ES High resolution turbomolecular pumped sputter coater.
Jeol JXA-8230 Electron Probe Micro-Analyzer (EPMA)
Electron Microprobes have been widely used for over 40 years for non-destructive, quantitative, elemental microanalysis of solid materials.
Joel 2100F Transmission Electron Microscope (TEM)
The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultra-h
Jeol 840A Scanning Electron Microscope (SEM)
The JEOL 840A is a medium resol
Jeol JSM 7600F Field Emission Gun Ultra-High Resolution Scanning Electron Microscope Electron Microscopes
The JSM-7600F is a state of-the-art thermal field emission gun scanning electron microscope.
CETR UMT 2EC Tribocorrosion Testing System
The Tribocorrosion tester is an instrument that allows simultaneous measurement of the tribological and electrochemical characterizations of materi
Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes
The JSM-6390LV is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm.