Jeol 840A Scanning Electron Microscope (SEM)

Model:

840A Scanning Electron Microscope (SEM)

Manufacturer:

Supplier:

Jeol 840A Scanning Electron Microscope (SEM)

The JEOL 840A is a medium resolution scanning electron microscope used for conventional microstructure analyses. The instrument is designed for the analysis focusing on the physical and chemical microstructure of solid state materials allowing spatially resolved compositional analysis by an EDAX Genesis 200 X-ray emission spectroscopy system.

Category:

Microscope

Disciplines:

Mining, Metallurgy, Meaterialography

Location

Mintek

200 Malibongwe Drive, Strijdom Park

Randburg

2125

Contact Person/s

Name: Deshenthree Chetty
Phone: +27 11-709-4523
Email: Deshc@mintek.co.za

Funding Information

Year of Acquisition:

1987

Locations

Agricultural Research Council	North West University	University of Johannesburg
Cape Penninsula University of Technology	Oceanographic Research Institute	University of KwaZulu-Natal
Central University of Technology	Rhodes University	University of Limpopo
Centre for Proteomics and Genomics Research	Sefako Makgato Health Sciences University	University of Pretoria
Council for Scientific and Industrial Research (CSIR)	South African Astronomical Observatory	University of South Africa
Durban University of Technology	South African Environmental Observation Network (SAEON)	University of the Free State
Hartebeesthoek Radio Astronomy Observatory (HartRAO)	South African Institute for Aquatic Biodiversity (SAIAB)	University of the Western Cape
iThemba LABS	South African National Space Agency (SANSA)	University of the Witwatersrand
Mintek	South African Nuclear Energy Corporation (NECSA)	University of Venda
National Institute for Communicable Diseases	Stellenbosch University	University of Zululand
National Museum	Tshwane University of Technology	Vaal University of Technology
National Zoological Gardens	University of Cape Town	Walter Sisulu University
Nelson Mandela Metropolitan University	University of Fort Hare

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Jeol 840A Scanning Electron Microscope (SEM)

Contact Person/s

Locations