Jeol 840A Scanning Electron Microscope (SEM)

Model: 
840A Scanning Electron Microscope (SEM)
Make: 

The JEOL 840A is a medium resolution scanning electron microscope used for conventional microstructure analyses. The instrument is designed for the analysis focusing on the physical and chemical microstructure of solid state materials allowing spatially resolved compositional analysis by an EDAX Genesis 200 X-ray emission spectroscopy system.

Category: 
Microscope
Disciplines: 
Mining, Metallurgy, Meaterialography
Location
Mintek
200 Malibongwe Drive, Strijdom Park
Randburg
2125

Contact Person/s

Name: Deshenthree Chetty
Phone: +27 11-709-4523
Email: Deshc@mintek.co.za
Funding Information
Year of Acquisition: 
1987