Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes
Model:
JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer
Manufacturer:
Supplier:
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The JSM-6390LV is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm. The customizable GUI interface allows the instrument to be intuitively operated, and Smile Shot™ software ensures optimum operation settings.
The low vacuum mode, which can be accessed by the click of a mouse, allows for observation of specimens that cannot be viewed at high vacuum due to excessive water content or because of a non-conductive surface. The specimen chamber can accommodate a specimen of up to 6-inches in diameter. Standard automated features include auto focus/auto stigmator, auto gun (saturation, bias and alignment), and automatic contrast and brightness.
Condition:
New
Category:
Microscope - Electron Microscopes - Scanning Electron Microscope (SEM)
Disciplines:
Botany, Entomology
Life Expectancy:
20years