Jeol CP II Cross Section Polisher
Model:
CP II Cross Section Polisher
Manufacturer:
Supplier:
The Cross Section Polisher uses an Argon Ion Beam to prepare cross sections of materials for characterization by Scanning Electron Microscopy. The method is useful for the observation of layered structures, interfaces and the microstructure of metals, ceramics semiconductor devices and composites. It is important in the case of difficult-to-polish soft materials and difficult-to-cut hard materials.
Category:
Other
Disciplines:
Nanoscience, Solid State Physics
Life Expectancy:
15years
Contact Person/s
Grantholder
Title: Prof
First Name: JH
Last Name: Neethling
Phone: +27 41-504-2143
Email: jan.neethling@nmmu.ac.za
First Name: JH
Last Name: Neethling
Phone: +27 41-504-2143
Email: jan.neethling@nmmu.ac.za