Jeol CP II Cross Section Polisher

Model: 
CP II Cross Section Polisher
Make: 

The Cross Section Polisher uses an Argon Ion Beam to prepare cross sections of materials for characterization by Scanning Electron Microscopy. The method is useful for the observation of layered structures, interfaces and the microstructure of metals, ceramics semiconductor devices and composites. It is important in the case of difficult-to-polish soft materials and difficult-to-cut hard materials.

Category: 
Other
Disciplines: 
Nanoscience, Solid State Physics
Life Expectancy: 
15years
Location
Department: 
Physics
Building: 
Building 13, Summerstrand Campus (South)
Nelson Mandela Metropolitan University
University Way, Summerstrand
Port Elizabeth
6001

Contact Person/s

Name: Prof JH Neethling
Phone: +27 41-504-2143
Email: jan.neethling@nmmu.ac.za

Grantholder

Title: Prof
First Name: JH
Last Name: Neethling
Phone: +27 41-504-2143
Email: jan.neethling@nmmu.ac.za
Funding Information
Year of Acquisition: 
2010