Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope
Model:
JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope
Manufacturer:
Supplier:
JEOL ARM200F double aberration corrected high resolution transmission electron microscope (HRTEM) with field emission gun (FEG), and energy dispersive X-ray spectrometry system (EDS), scanning transmission electron microscopy (STEM) attachment, high angle annular dark-field STEM detector (HAADF), electron energy loss spectroscopy (EELS) system and two spherical aberration corrected (Cs) lenses giving the HRTEM a point resolution of 0.11nm and a STEM resolution of 0.08nm.
Condition:
New
Category:
Microscope
Disciplines:
Material Science, Solid State Physics
Life Expectancy:
15years
Contact Person/s
Grantholder
Title: Prof
First Name: JH
Last Name: Neethling
Phone: +27 41-504-2143
Email: jan.neethling@nmmu.ac.za
First Name: JH
Last Name: Neethling
Phone: +27 41-504-2143
Email: jan.neethling@nmmu.ac.za