Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope

Model: 
JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope
Make: 

JEOL ARM200F double aberration corrected high resolution transmission electron microscope (HRTEM) with field emission gun (FEG), and energy dispersive X-ray spectrometry system (EDS), scanning transmission electron microscopy (STEM) attachment, high angle annular dark-field STEM detector (HAADF), electron energy loss spectroscopy (EELS) system and two spherical aberration corrected (Cs) lenses giving the HRTEM a point resolution of 0.11nm and a STEM resolution of 0.08nm.

Condition: 
New
Category: 
Microscope
Disciplines: 
Material Science, Solid State Physics
Life Expectancy: 
15years
Location
Department: 
Centre for HRTEM
Building: 
Building 124, South Campus
Nelson Mandela Metropolitan University
University Way, Summerstrand
Port Elizabeth
6001

Contact Person/s

Name: Prof JH Neethling
Phone: +27 41-504-2143
Email: jan.neethling@nmmu.ac.za
Estimated Cost and Availability
Internal: 
R350
External: 
R650
Private Sector: 
R3 000

Grantholder

Title: Prof
First Name: JH
Last Name: Neethling
Phone: +27 41-504-2143
Email: jan.neethling@nmmu.ac.za
Funding Information
Equipment Price: 
R45,436,890
Year of Acquisition: 
2010