Equipment Filter

Jeol JSM 7500F Scanning Electron Microscope

Jeol JSM 7500F Scanning Electron Microscope

The JSM-7500F is an analytical Field Emission 

Institution: 
Council for Scientific and Industrial Research (CSIR)
Microscope
Jeol JEM 2100 Transmission Electron Microscope Electron Microscopes

Jeol JEM 2100 Transmission Electron Microscope Electron Microscopes

The JEM-2100 Electron Microscope provides solutions for a wide range of problems in the fields of nanoelectronics, materials, and biological scienc

Institution: 
Council for Scientific and Industrial Research (CSIR)
MicroscopeElectron MicroscopesTransmission Electron Microscope (TEM)
Jeol 200kV FEGTEM Model: 2100F Transmission Electron Microscope (TEM) with associated Cryo-Equipment Electron Microscopes

Jeol 200kV FEGTEM Model: 2100F Transmission Electron Microscope (TEM) with associated Cryo-Equipment Electron Microscopes

The 200kV Transmission Electron Microscope (TEM) is capable of handling frozen biological specimens.

Institution: 
University of Pretoria
MicroscopeElectron MicroscopesTransmission Electron Microscope (TEM)Field Emission Gun TEM (FEG-TEM)
Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes

Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes

The JSM-6390LV is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm.

Institution: 
University of Fort Hare
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
Jeol JSM 7600F Field Emission Gun Ultra-High Resolution Scanning Electron Microscope Electron Microscopes

Jeol JSM 7600F Field Emission Gun Ultra-High Resolution Scanning Electron Microscope Electron Microscopes

The JSM-7600F is a state of-the-art thermal field emission gun scanning electron microscope.

Institution: 
Tshwane University of Technology
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
Jeol 840A Scanning Electron Microscope (SEM)

Jeol 840A Scanning Electron Microscope (SEM)

The JEOL 840A is a medium resol

Institution: 
Mintek
Microscope
Joel 2100F Transmission Electron Microscope (TEM)

Joel 2100F Transmission Electron Microscope (TEM)

The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultra-h

Institution: 
Mintek
Microscope
Jeol JSM 7900F FE-SEM

Jeol JSM 7900F FE-SEM

The field emission scanning electron microscope (FE-SEM) is an ultra-high-resolution materials characterization equipment that can be used for effe

Institution: 
University of Johannesburg
Microscope