The AFM CP-II probes the surface of a material with a sharp tip, which is a few microns long and less than 10nm in diameter.
The Digital Instruments CP-II Scanning Probe Microscope (SPM) provides high performance and value for material and physical science research.
AFM measures the atomic level forces between a sharp probing tip attached to a cantilever spring and a sample surface.
The Veeco TappingMode AFM operates by scanning a tip attached to the end of an oscillating cantilever across the sample surface.
The Philips CM200 transmission electron microscope (TEM) operating at up to 200 kV is a very versatile microscope.
The Dimension 3100 AFM is an instrument capable of imaging specimens with a horizontal and vertical resolution down to a fraction of a nanometer.
The FEI Quanta 400 FEG is the most versatile high resolution low-vacuum FEG SEM with extended low-vacuum capabilities for the really challenging sa
The Nova 600 NanoLab brings new capabilities and flexibility to researchers and developers needing to create, modify, and characterize complex stru
The FEI Tecnai transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, ma
Atomic force microscopy utilizes the combination of an advanced scanning probe microscope, sophisticated software, and a specific mode or tec