Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

Model: 
Atomic Force Microscope (AFM)
Make: 
Supplier: 

The Veeco TappingMode AFM operates by scanning a tip attached to the end of an oscillating cantilever across the sample surface. The cantilever is oscillated at or slightly below its resonance frequency with amplitude ranging typically from 20nm to 100nm. The tip lightly “taps” on the sample surface during scanning, contacting the surface at the bottom of its swing.

Category: 
Microscope - Atomic Force Microscope (AFM)
Location
University of the Witwatersrand
1 Jan Smuts Ave
Johannesburg
2001

Contact Person/s

Name: Dr Sanja Potgieter-Vermaak
Email: Sanja.Potgieter-Vermaak@wits.ac.za
Funding Information
Year of Acquisition: 
2006