Veeco

Veeco Wyko NT1100 Optical Profiler (OP)

The new Roche Lightcycler 480 real-time PCR system (HTC) allows 96-well and 384-well QRT-PCR analysis in microtiter plate format. It is compatible with automation systems and LIMS strategies (with built-in bar code readers for sample tracking). Futhermore, the instrument will allow multiplexed analysis with 5 excitation filters and 6 detection filters. The 96-well and 384-well thermoblocks are interchangeable and allow flexibility in throughput.

Grantholder

Title: Prof
First Name: M
Last Name: Harting
Phone: +27 21-650-3359
Email: Margit.harting@uct.ac.za
Veeco Wyko NT1100 Optical Profiler (OP)

Contact Person/s

Name: Prof M Harting
Phone: +27 21-650-3359
Email: Margit.harting@uct.ac.za

Veeco Nanoman V Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

The major hardware components of the equipment are the scanner, with a closed (x-y) feed-back loop which provides optimum positioning accuracy and the nano-scope controller which optionally incorporates a scanning tunneling microscope.

Grantholder

Title: Dr
First Name: RN
Last Name: Nematudi
Phone: +27 21-843-1152
Email: rudzi@tlabs.ac.za
Veeco Nanoman V Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

Contact Person/s

Name: Lowry Conradie
Phone: +27 21-843-1050
Email: conradie@tlabs.ac.za

Veeco Dimension 3100 Scanning Probe Microscope Scanning Probe Microscopes

The Dimension 3100 AFM is an instrument capable of imaging specimens with a horizontal and vertical resolution down to a fraction of a nanometer. The instrument works by measuring the deflection produced by a sharp tip on micron-sized cantilever as it scans across the surface of the specimen. Sample sizes that can be handled by the instrument range from small pieces to 150 mm diameter wafers.

Contact Person/s

Name: Prof Witcomb
Phone: +27 11-717-1330
Email: mikew@gecko.biol.wits.ac.za
Veeco Dimension 3100 Scanning Probe Microscope Scanning Probe Microscopes

Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

The Veeco TappingMode AFM operates by scanning a tip attached to the end of an oscillating cantilever across the sample surface. The cantilever is oscillated at or slightly below its resonance frequency with amplitude ranging typically from 20nm to 100nm. The tip lightly “taps” on the sample surface during scanning, contacting the surface at the bottom of its swing.

Contact Person/s

Name: Dr Sanja Potgieter-Vermaak
Email: Sanja.Potgieter-Vermaak@wits.ac.za
Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

AFM measures the atomic level forces between a sharp probing tip attached to a cantilever spring and a sample surface. AFM is particularly attractive to cell biologists as it can yield high resolution spatial images of live cells under near physiological conditions as well as evaluate the physical parameters in biological materials, such as material properties and binding forces.

Grantholder

Title: Prof
First Name: NJ
Last Name: Coville
Phone: +27 11-717-6738
Email: neil.coville@wits.co.za
Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

Contact Person/s

Name: Prof NJ Coville
Phone: +27 11-717-6738
Email: neil.coville@wits.co.za

Veeco diCP-II Scanning Probe Microscope Scanning Probe Microscopes

The Digital Instruments CP-II Scanning Probe Microscope (SPM) provides high performance and value for material and physical science research. The CP-II head, designed to accept an on-axis microscope, utilizes patented ScanMaster closed-loop scan-linearization to image areas of up to 100x100 µm. The system is designed for ease-of-use with integrated high-magnification color optics and a motorized Z stage that makes finding features, changing the pre-mounted tips, and switching samples fast and easy.

Contact Person/s

Name: Prof Witcomb
Phone: +27 11-717-1330
Email: mikew@gecko.biol.wits.ac.za