Veeco AFM CP-II Atomic Force Microscope (AFM)
Model:
AFM CP-II
Manufacturer:
Supplier:
The AFM CP-II probes the surface of a material with a sharp tip, which is a few microns long and less than 10nm in diameter. It is essentially a profiler with unprecedented 3-D resolutions.
Category:
Microscope - Atomic Force Microscope (AFM)
Disciplines:
Surface Characterisations of Materials
Grantholder
Title: Prof
First Name: S
Last Name: Chikwembani
Phone: +27 47-502-2919
Email: schikwembani@wsu.ac.za
First Name: S
Last Name: Chikwembani
Phone: +27 47-502-2919
Email: schikwembani@wsu.ac.za