Veeco AFM CP-II Atomic Force Microscope (AFM)

Model: 
AFM CP-II
Make: 
Supplier: 

The AFM CP-II probes the surface of a material with a sharp tip, which is a few microns long and less than 10nm in diameter. It is essentially a profiler with unprecedented 3-D resolutions.

Category: 
Microscope - Atomic Force Microscope (AFM)
Disciplines: 
Surface Characterisations of Materials
Location
Faculty: 
Science
Department: 
Physics
Building: 
Walter Sisulu University
Myezo Park
Mthatha‎
5117

Grantholder

Title: Prof
First Name: S
Last Name: Chikwembani
Phone: +27 47-502-2919
Email: schikwembani@wsu.ac.za
Funding Information
Year of Acquisition: 
2007