Veeco diCP-II Scanning Probe Microscope Scanning Probe Microscopes

Model: 
diCP-II Scanning Probe Microscope
Make: 
Supplier: 

The Digital Instruments CP-II Scanning Probe Microscope (SPM) provides high performance and value for material and physical science research. The CP-II head, designed to accept an on-axis microscope, utilizes patented ScanMaster closed-loop scan-linearization to image areas of up to 100x100 µm. The system is designed for ease-of-use with integrated high-magnification color optics and a motorized Z stage that makes finding features, changing the pre-mounted tips, and switching samples fast and easy.

Category: 
Microscope - Scanning Probe Microscopes
Location
University of the Witwatersrand
1 Jan Smuts Ave
Johannesburg
2001

Contact Person/s

Name: Prof Witcomb
Phone: +27 11-717-1330
Email: mikew@gecko.biol.wits.ac.za
Funding Information
Year of Acquisition: 
2006