Veeco diCP-II Scanning Probe Microscope Scanning Probe Microscopes
Model:
diCP-II Scanning Probe Microscope
Manufacturer:
Supplier:
The Digital Instruments CP-II Scanning Probe Microscope (SPM) provides high performance and value for material and physical science research. The CP-II head, designed to accept an on-axis microscope, utilizes patented ScanMaster closed-loop scan-linearization to image areas of up to 100x100 µm. The system is designed for ease-of-use with integrated high-magnification color optics and a motorized Z stage that makes finding features, changing the pre-mounted tips, and switching samples fast and easy.
Category:
Microscope - Scanning Probe Microscopes