Veeco Dimension 3100 Scanning Probe Microscope Scanning Probe Microscopes

Model: 
Dimension 3100 Scanning Probe Microscope
Make: 
Supplier: 

The Dimension 3100 AFM is an instrument capable of imaging specimens with a horizontal and vertical resolution down to a fraction of a nanometer. The instrument works by measuring the deflection produced by a sharp tip on micron-sized cantilever as it scans across the surface of the specimen. Sample sizes that can be handled by the instrument range from small pieces to 150 mm diameter wafers.

Category: 
Microscope - Scanning Probe Microscopes
Location
University of the Witwatersrand
1 Jan Smuts Ave
Johannesburg
2001

Contact Person/s

Name: Prof Witcomb
Phone: +27 11-717-1330
Email: mikew@gecko.biol.wits.ac.za
Funding Information
Year of Acquisition: 
2006