Veeco Dimension 3100 Scanning Probe Microscope Scanning Probe Microscopes

The Dimension 3100 AFM is an instrument capable of imaging specimens with a horizontal and vertical resolution down to a fraction of a nanometer. The instrument works by measuring the deflection produced by a sharp tip on micron-sized cantilever as it scans across the surface of the specimen. Sample sizes that can be handled by the instrument range from small pieces to 150 mm diameter wafers.