Bruker Atomic Force Microscope Atomic Force Microscope (AFM)

Model: 
Atomic Force Microscope
Make: 

Atomic force microscopy utilizes the combination of an advanced scanning probe microscope, sophisticated software, and a specific mode or technique that enables manufacturers, engineers, and researchers to precisely measure, investigate, and image the critical properties of a large variety of surfaces and samples. The main feature that all atomic force microscopes have in common is that the measurements are performed with a sharp probe scanning over a sample while maintaining a very close spacing to the surface. Atomic force microscopy was the first technology to produce real-space images of atomic arrangements on flat surfaces and is now most commonly used to perform very precise, 3D measurements on the angstrom-to-micrometer scale. 

Status: 
Unavailable
Category: 
Microscope - Atomic Force Microscope (AFM)
Location
Department: 
National Centre for Nano-Structured Materials
Building: 
Building 19B Scientia Campus
Meiring Naude Road
Brummeria
Pretoria
0184

Contact Person/s

Name: Margaret Ward
Phone: +27 12-841-3707
Email: mward@csir.co.za

Grantholder

Title: Mr
First Name: Grant
Last Name: Holder
Phone: +27 11-111-1111
Email: grant@holder.com