Bruker Atomic Force Microscope Atomic Force Microscope (AFM)

Atomic force microscopy utilizes the combination of an advanced scanning probe microscope, sophisticated software, and a specific mode or technique that enables manufacturers, engineers, and researchers to precisely measure, investigate, and image the critical properties of a large variety of surfaces and samples. The main feature that all atomic force microscopes have in common is that the measurements are performed with a sharp probe scanning over a sample while maintaining a very close spacing to the surface. Atomic force microscopy was the first technology to produce real-space images of atomic arrangements on flat surfaces and is now most commonly used to perform very precise, 3D measurements on the angstrom-to-micrometer scale.