Equipment Filter

Veeco diCP-II Scanning Probe Microscope Scanning Probe Microscopes

The Digital Instruments CP-II Scanning Probe Microscope (SPM) provides high performance and value for material and physical science research.

Institution: 
University of the Witwatersrand
Microscope›Scanning Probe Microscopes
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Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

AFM measures the atomic level forces between a sharp probing tip attached to a cantilever spring and a sample surface.

Institution: 
University of the Witwatersrand
Microscope›Atomic Force Microscope (AFM)
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Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

The Veeco TappingMode AFM operates by scanning a tip attached to the end of an oscillating cantilever across the sample surface.

Institution: 
University of the Witwatersrand
Microscope›Atomic Force Microscope (AFM)
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Philips CM200 Transmission Electron Microscope (TEM) Electron Microscopes

Philips CM200 Transmission Electron Microscope (TEM) Electron Microscopes

The Philips CM200 transmission electron microscope (TEM) operating at up to 200 kV is a very versatile microscope.

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)
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Veeco Dimension 3100 Scanning Probe Microscope Scanning Probe Microscopes

Veeco Dimension 3100 Scanning Probe Microscope Scanning Probe Microscopes

The Dimension 3100 AFM is an instrument capable of imaging specimens with a horizontal and vertical resolution down to a fraction of a nanometer.

Institution: 
University of the Witwatersrand
Microscope›Scanning Probe Microscopes
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FEI Quanta 400 SEM Electron Microscopes

FEI Quanta 400 SEM Electron Microscopes

The FEI Quanta 400 FEG is the most versatile high resolution low-vacuum FEG SEM with extended low-vacuum capabilities for the really challenging sa

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
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FEI Nova 600 Nanolab Electron Microscopes

FEI Nova 600 Nanolab Electron Microscopes

The Nova 600 NanoLab brings new capabilities and flexibility to researchers and developers needing to create, modify, and characterize complex stru

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)›Focussed Ion-Beam SEM (FIB-SEM)
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FEI Tecnai G2 Spirit Transmission Electron Microscope (TEM) Electron Microscopes

FEI Tecnai G2 Spirit Transmission Electron Microscope (TEM) Electron Microscopes

The FEI Tecnai transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, ma

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)
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FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)›Focussed Ion-Beam SEM (FIB-SEM)
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Jeol JSM-840 SEM Electron Microscopes

Jeol JSM-840 SEM Electron Microscopes

The JEOL JSM-840 is a multi-purpose SEM capable of acceleration voltages up to 40kV.

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
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