FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes
Model:
Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
Manufacturer:
Supplier:
The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structures of materials, by way of its dual beam facility.
Status:
Available
Condition:
New
Category:
Microscope - Electron Microscopes - Scanning Electron Microscope (SEM) - Focussed Ion-Beam SEM (FIB-SEM)
Disciplines:
Chemistry, Mechanical Engineering, Metallurgy, Physics
Life Expectancy:
10years
Contact Person/s
Grantholder
Title: Prof
First Name: MJ
Last Name: Witcomb
Phone: +27 11-717-1330
Email: michael.witcomb@wits.co.za
First Name: MJ
Last Name: Witcomb
Phone: +27 11-717-1330
Email: michael.witcomb@wits.co.za