FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

Model: 
Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
Make: 

The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structures of materials, by way of its dual beam facility.

Status: 
Available
Condition: 
New
Category: 
Microscope - Electron Microscopes - Scanning Electron Microscope (SEM) - Focussed Ion-Beam SEM (FIB-SEM)
Disciplines: 
Chemistry, Mechanical Engineering, Metallurgy, Physics
Life Expectancy: 
10years
Location
Faculty: 
Solid State Physics
Department: 
Microscopy and Microanalysis Unit
Building: 
Biology Building, Room 5A
University of the Witwatersrand
1 Jan Smuts Ave
Johannesburg
2001

Contact Person/s

Name: Prof MJ Witcomb
Phone: +27 11-717-1330
Email: michael.witcomb@wits.co.za
Estimated Cost and Availability
Internal: 
R60
External: 
R150
Private Sector: 
R4 000

Grantholder

Title: Prof
First Name: MJ
Last Name: Witcomb
Phone: +27 11-717-1330
Email: michael.witcomb@wits.co.za
Funding Information
Equipment Price: 
R17,993,291
Year of Acquisition: 
2009