FEI

FEI Quanta 600 Mineral Liberation Analyser

The FEI Quanta 600 FEG Mineral Liberation Analyser, is used in the examination, and quantification of the mineralogical nature of ores, concentrates and successor products. This instrument is equipped with a Schottky field emission source and two Bruker silicon drift energy dispersive spectrometers, as well as Mineral Liberation Analysis software.

Contact Person/s

Name: Deshenthree Chetty
Phone: +27 11-709-4523
Email: Deshc@mintek.co.za
FEI Quanta 600 Mineral Liberation Analyser

FEI Nova Nano SEM200 High Resolution Scanning Electron Microscope (HR-SEM) Upgrades (Raith Lithography, EBSD and EDAX Systems)

The FEI Novaô Nano SEM provides for high-quality nanoscale research tools for a variety of applications that involve sample characterization, analysis, nanoprototyping, and S/TEM sample preparation. Small and large samples can easily be accommodated inside the large chamber, on the Nova NanoSEMís high precision, high stability stage.

Contact Person/s

Name: Robert Tshikhudo
Phone: +27 11-709-4303
Email: robertt@mintek.co.za
FEI Nova Nano SEM200 High Resolution Scanning Electron Microscope (HR-SEM) Upgrades (Raith Lithography, EBSD and EDAX Systems)

FEI Tecnai F20 Transmission Electron Microscope (TEM) Electron Microscopes

The FEI Tecnai F20 is a 200Kv Field Emission Gun (FEG) High Resolution Cryo-TEM. This instrument is able to achieve high resolution images of objects such as protein molecules and very low temperatures.

Grantholder

Title: Prof
First Name: BT
Last Name: Sewell
Phone: +27 21-650-2817
Email: trevor.sewell@uct.ac.za
FEI Tecnai F20 Transmission Electron Microscope (TEM) Electron Microscopes

Contact Person/s

Name: Prof BT Sewell
Phone: +27 21-650-2817
Email: trevor.sewell@uct.ac.za

FEI Helix Detector (HD) Gaseous Analytical Detector (GAD) and Electron Backscatter Diffraction Detector (EBDD)

The equipment consists of additional detectors for the Nova NanoSEM: Helix Detector. This is a detector which allows for imaging specimens using the immersion (high resolution) lens in low vacuum mode to obtain ultra-high resolution images of non-conductive specimens. The Gaseous Analytical Back-Scattered Detector has an X-ray cone to reduce spurious beam skirt X-rays, thereby improving the accuracy of X-ray analysis in low vacuum mode. The EBSD system is an upgrade to the EDAX X-ray spectrometer to allow accurate imaging of surface orientation and phase identification.

Grantholder

Title: Dr
First Name: E
Last Name: van der Lingen
Phone: +27 11-709-4471
Email: elmavdL@mintek.co.za

Contact Person/s

Name: Deshenthree Chetty
Phone: +27 11-709-4523
Email: Deshc@mintek.co.za

FEI Quanta 600F FEG Mineral Liberation Analyser (MLA)

The FEI Quanta 600F FEG Mineral Liberation Analyser, is used in the examination, and quantification of the mineralogical nature of ores, concentrates and successor products. This instrument is equipped with a Schottky field emission source and two Bruker silicon drift energy dispersive spectrometers, as well as Mineral Liberation Analysis software.

Grantholder

Title: Prof
First Name: KS
Last Name: Viljoen
Phone: +27 11-559-4710
Email: fanusv@uj.ac.za
FEI Quanta 600F FEG Mineral Liberation Analyser (MLA)

Contact Person/s

Name: Prof KS Viljoen
Phone: +27 11-559-4710
Email: fanusv@uj.ac.za

FEI Technai G2 F20 S-Twin MAT HRTEM Electron Microscopes

The instrument is a 200 kV FEG-TEM, with all the possible analytical facilities for full materials related analyses, equipped with scanning coils, HAADF detector, EDS X-ray system, Gatan EELS, compu-stage and a 2k x 2k camera, plus a software code ‘True Image’ that allows for sub Å resolution, plus software to capture full 3-D tomography images.

Grantholder

Title: Prof
First Name: D
Last Name: Knoesen
Phone: +27 21-959-2236
Email: dknoesen@uwc.ac.za
FEI Technai G2 F20 S-Twin MAT HRTEM Electron Microscopes

Contact Person/s

Name: Prof D Knoesen
Phone: +27 21-959-2236
Email: dknoesen@uwc.ac.za

FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes

The FEI Spirit is a high brightness (LaB6 sourced) high magnification, high resolution, 120kV TEM that is equipped with an ultrathin windowed energy dispersive x-ray analysis system (EDX) allowing for the characterisation of the microstructure and composition of advanced materials encountered in nanotechnology research.

Grantholder

Title: Prof
First Name: MJ
Last Name: Witcomb
Phone: +27 11-717-1330
Email: michael.witcomb@wits.co.za
FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes

Contact Person/s

Name: Prof MJ Witcomb
Phone: +27 11-717-1330
Email: michael.witcomb@wits.co.za

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structures of materials, by way of its dual beam facility.

Grantholder

Title: Prof
First Name: MJ
Last Name: Witcomb
Phone: +27 11-717-1330
Email: michael.witcomb@wits.co.za
FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

Contact Person/s

Name: Prof MJ Witcomb
Phone: +27 11-717-1330
Email: michael.witcomb@wits.co.za

FEI Tecnai G2 Spirit Transmission Electron Microscope (TEM) Electron Microscopes

The FEI Tecnai transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries. With nearly twenty models to choose from, the Tecnai G2 Series combines modern technology with the stringent demands of an innovative scientific community.

FEI Tecnai G2 Spirit Transmission Electron Microscope (TEM) Electron Microscopes