The new XL40 ESEM features a large chamber, a 150 mm stage and full ESEM capability, allowing users to analyze failures in larger samples even in low vacuum mode. The system is also the basis of the Mineral Liberation Analyzer -- a dedicated system representing a breakthrough for the mining industry.
The FEI Quanta 600 FEG Mineral Liberation Analyser, is used in the examination, and quantification of the mineralogical nature of ores, concentrates and successor products. This instrument is equipped with a Schottky field emission source and two Bruker silicon drift energy dispersive spectrometers, as well as Mineral Liberation Analysis software.
The FEI Novaô Nano SEM provides for high-quality nanoscale research tools for a variety of applications that involve sample characterization, analysis, nanoprototyping, and S/TEM sample preparation. Small and large samples can easily be accommodated inside the large chamber, on the Nova NanoSEMís high precision, high stability stage.
The FEI Tecnai F20 is a 200Kv Field Emission Gun (FEG) High Resolution Cryo-TEM. This instrument is able to achieve high resolution images of objects such as protein molecules and very low temperatures.
The equipment consists of additional detectors for the Nova NanoSEM: Helix Detector. This is a detector which allows for imaging specimens using the immersion (high resolution) lens in low vacuum mode to obtain ultra-high resolution images of non-conductive specimens. The Gaseous Analytical Back-Scattered Detector has an X-ray cone to reduce spurious beam skirt X-rays, thereby improving the accuracy of X-ray analysis in low vacuum mode. The EBSD system is an upgrade to the EDAX X-ray spectrometer to allow accurate imaging of surface orientation and phase identification.
The FEI Quanta 600F FEG Mineral Liberation Analyser, is used in the examination, and quantification of the mineralogical nature of ores, concentrates and successor products. This instrument is equipped with a Schottky field emission source and two Bruker silicon drift energy dispersive spectrometers, as well as Mineral Liberation Analysis software.
The instrument is a 200 kV FEG-TEM, with all the possible analytical facilities for full materials related analyses, equipped with scanning coils, HAADF detector, EDS X-ray system, Gatan EELS, compu-stage and a 2k x 2k camera, plus a software code ‘True Image’ that allows for sub Å resolution, plus software to capture full 3-D tomography images.
The FEI Spirit is a high brightness (LaB6 sourced) high magnification, high resolution, 120kV TEM that is equipped with an ultrathin windowed energy dispersive x-ray analysis system (EDX) allowing for the characterisation of the microstructure and composition of advanced materials encountered in nanotechnology research.
The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structures of materials, by way of its dual beam facility.
The FEI Tecnai transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries. With nearly twenty models to choose from, the Tecnai G2 Series combines modern technology with the stringent demands of an innovative scientific community.
