FEI Nova Nano SEM200 High Resolution Scanning Electron Microscope (HR-SEM) Upgrades (Raith Lithography, EBSD and EDAX Systems)
Model:
Nova Nano SEM200 High Resolution Scanning Electron Microscope (HR-SEM) Upgrades (Raith Lithography, EBSD and EDAX Systems)
Manufacturer:
Supplier:
The FEI Novaô Nano SEM provides for high-quality nanoscale research tools for a variety of applications that involve sample characterization, analysis, nanoprototyping, and S/TEM sample preparation. Small and large samples can easily be accommodated inside the large chamber, on the Nova NanoSEMís high precision, high stability stage.
Category:
Microscope
Disciplines:
Science (Research), Engineering, Mining
Life Expectancy:
10years