Jeol JSM-840 SEM Electron Microscopes

Model: 
JSM-840 SEM
Make: 
Supplier: 

The JEOL JSM-840 is a multi-purpose SEM capable of acceleration voltages up to 40kV. This SEM features an Orion digital image capture system running on Win98, an EDS system making it suitable for elemental analysis, BSE, and a new NanoMaker Pattern Generator system with beam blanker for electron beam lithography to manufacture nano-scaled patterns.

Category: 
Microscope - Electron Microscopes - Scanning Electron Microscope (SEM)
Location
University of the Witwatersrand
1 Jan Smuts Ave
Johannesburg
2001
Funding Information
Year of Acquisition: 
1985