Equipment Filter

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)›Focussed Ion-Beam SEM (FIB-SEM)
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FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes

FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes

The FEI Spirit is a high brightness (LaB6 sourced) high magnification, high resolution, 120kV TEM that is equipped with an ultrathin windowed energ

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)
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FEI Technai G2 F20 S-Twin MAT HRTEM Electron Microscopes

FEI Technai G2 F20 S-Twin MAT HRTEM Electron Microscopes

The instrument is a 200 kV FEG-TEM, with all the possible analytical facilities for full materials related analyses, equipped with scanning coils,

Institution: 
University of the Western Cape
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)›High Resolution TEM (HR-TEM)
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Princeton Applies Science and Uniscan 370 Princeton Applied Research Scanning Electrochemical Microscopy (SCEM) workstation Model TSTRM-12 Uniscan 12-Channel Robotic Electrochemical Sensor Testing Station Electron Microscopes

The Multi-Channel Scanning Electrochemical Workstation is a hyphenated instrumentation that consists of a Model 370 Princeton Applied Research (PAR

Institution: 
University of the Western Cape
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
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FEI Tecnai F20 Transmission Electron Microscope (TEM) Electron Microscopes

FEI Tecnai F20 Transmission Electron Microscope (TEM) Electron Microscopes

The FEI Tecnai F20 is a 200Kv Field Emission Gun (FEG) High Resolution Cryo-TEM.

Institution: 
University of Cape Town
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)
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Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.

Institution: 
University of Zululand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
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Field Emission Gun Scanning Electron Microscope (FEG-SEM) QEMSCAN Electron Microscopes

Field Emission Gun Scanning Electron Microscope (FEG-SEM) QEMSCAN Electron Microscopes

Automated mineralogy is an analytical tool which provides rapid, reproducible and statistically reliable quantitative information on minerals and c

Institution: 
University of Cape Town
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
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Sputtering System Sigma VP FE-SEM with Oxford EDS Electron Microscopes

Sputtering System Sigma VP FE-SEM with Oxford EDS Electron Microscopes

The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.

Institution: 
University of Zululand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
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Electron nano-beam lithography JEBL-7001F Electron Microscopes

Electron nano-beam lithography JEBL-7001F Electron Microscopes

JEBL-7001F Electron Nano-beam Lithography with Four Nano Probe Electron Device Testing Station and Cantilever Probe Scanner at low Temperatures is

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
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Jeol JEM 2100 Transmission Electron Microscope (TEM) Electron Microscopes

Jeol JEM 2100 Transmission Electron Microscope (TEM) Electron Microscopes

The TEM is configured to be an analytical facility to investigate and characterize the internal structure of very thin sections of material, up to

Institution: 
University of Johannesburg
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)
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