Sputtering System Sigma VP FE-SEM with Oxford EDS Electron Microscopes

Model: 
Sigma VP FE-SEM with Oxford EDS
Supplier: 

The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging. The SEM uses a schottky type field emitter which enables it to produce clearer images even at low kV. The resolution of the equipment is 1.3 nm at 20 kV and 2.8 nm at 1 kV. The alignment of the beam may be done electronically. The instrument is easy to use even by a beginner as it includes focusing assistance using a wobbler with variable amplitude. One is able to rotate and tilt the sample stage. The included detectors are an in-lens detector, ET-SE detector and a VP SE G3 detector as well as a STEM detector. Further the instrument includes an in-situ heating stage which enables one to make a movie of a process as it unfolds. It is a variable pressure machine thus biologists can use it too. This feature also enables one to image non-conducting samples without a need of coating them first. It will be possible to do elemental analysis within the SEM as it has an Oxford EDS attachment. It is supported by an Advanced Aztec Energy Package(software).

Status: 
Available
Condition: 
New
Category: 
Microscope - Electron Microscopes - Scanning Electron Microscope (SEM)
Life Expectancy: 
20years
Location
Faculty: 
University of Zululand
Department: 
Physics & Engineering
Building: 
Solid State Physics Research Laboratory, Room E3
KwaDlangezwa
Empangeni
3886

Contact Person/s

Name: Muzi Ndwandwe
Phone: +27 35-902-6563
Email: ndwandwe@gmail.com
Estimated Cost and Availability
Internal: 
R100
Per Hour
External: 
R120
Per Hour
Private Sector: 
R200
Per Hour
Time Spent Researching: 
40
Time Spent Teaching: 
40
Time Spent Other: 
20

Grantholder

Title: Dr
First Name: Muzi
Last Name: Ndwandwe
Phone: +27 35-902-6563
Email: muzi.ndwandwe@gmail.com
Funding Information
Equipment Price: 
R6,000,000