Sputtering System Sigma VP FE-SEM with Oxford EDS Electron Microscopes
The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging. The SEM uses a schottky type field emitter which enables it to produce clearer images even at low kV. The resolution of the equipment is 1.3 nm at 20 kV and 2.8 nm at 1 kV. The alignment of the beam may be done electronically. The instrument is easy to use even by a beginner as it includes focusing assistance using a wobbler with variable amplitude. One is able to rotate and tilt the sample stage. The included detectors are an in-lens detector, ET-SE detector and a VP SE G3 detector as well as a STEM detector.
Contact Person/s
Grantholder
Title: Dr
First Name: Muzi
Last Name: Ndwandwe
Phone: +27 35-902-6563
Email: muzi.ndwandwe@gmail.com
First Name: Muzi
Last Name: Ndwandwe
Phone: +27 35-902-6563
Email: muzi.ndwandwe@gmail.com
