Equipment Filter

Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

AFM measures the atomic level forces between a sharp probing tip attached to a cantilever spring and a sample surface.

Institution: 
University of the Witwatersrand
MicroscopeAtomic Force Microscope (AFM)
FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes

FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes

The FEI Spirit is a high brightness (LaB6 sourced) high magnification, high resolution, 120kV TEM that is equipped with an ultrathin windowed energ

Institution: 
University of the Witwatersrand
MicroscopeElectron MicroscopesTransmission Electron Microscope (TEM)
Carl Zeiss Auriga Field Emission Scanning Electron Microscope (FEG SEM) Electron Microscopes

Carl Zeiss Auriga Field Emission Scanning Electron Microscope (FEG SEM) Electron Microscopes

The Auriga FEG SEM is a fully digital 30 kV Hi Resolution FEG SEM equipped with EDS and a range of secondary and backscattered detectors peculiar t

Institution: 
University of the Western Cape
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
FEI Technai G2 F20 S-Twin MAT HRTEM Electron Microscopes

FEI Technai G2 F20 S-Twin MAT HRTEM Electron Microscopes

The instrument is a 200 kV FEG-TEM, with all the possible analytical facilities for full materials related analyses, equipped with scanning coils,

Institution: 
University of the Western Cape
MicroscopeElectron MicroscopesTransmission Electron Microscope (TEM)High Resolution TEM (HR-TEM)
Carl Zeiss Libra 120 PLUS Transmission Electron Microscope

Carl Zeiss Libra 120 PLUS Transmission Electron Microscope

The Zeiss Libra 120 Plus is a 120 kV transmission electron microscope particularly suitable for viewing biological samples.

Institution: 
Rhodes University
Microscope
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.

Institution: 
University of Zululand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)