Carl Zeiss Auriga Field Emission Scanning Electron Microscope (FEG SEM) Electron Microscopes

Model: 
Auriga Field Emission Scanning Electron Microscope (FEG SEM)
Make: 
Supplier: 

The Auriga FEG SEM is a fully digital 30 kV Hi Resolution FEG SEM equipped with EDS and a range of secondary and backscattered detectors peculiar to the machine.

It includes:

  •     a charge compensation facility
  •     an in situ cleaning function (a Zeiss patent)
  •     a four quadrant back scatter detector
  •     a chamber SE-detector
  •     a specimen Current Monitor
  •     two chamber IR-CCD cameras
  •     a EsB detector for AURIGA (this is CZ's patented detector for low kV work isolating specific electrons).
  •     pneumatic retractable Multi-mode STEM-detector Bright Field & Dark Field microscopy
  •     the Auriga can be operated using combined secondary electron and secondary ion detection.
  •     the Auriga's on-axis low voltage back scatter detector (EsB-energy  selective backscatter detector), allows for the viewing of backscattered electrons that exit the surface at a perpendicular angle to the service.
  •     The Auriga has excellent low kV imaging capabilities.

EDS from Oxford - Advanced AZtecEnergy package with an SDD 127 eV, the latest from Oxford offering

Category: 
Microscope - Electron Microscopes - Scanning Electron Microscope (SEM)
Disciplines: 
Materials Science
Life Expectancy: 
15years
Location
Faculty: 
Science
Department: 
Chemistry
Building: 
Electron Microscope Unit
University of the Western Cape
Modderdam East Road
Cape Town
7530

Contact Person/s

Name: Prof B Julies
Phone: +27 21-959-9461

Grantholder

Title: Prof
First Name: V
Last Name: Linkov
Phone: +27 21-959-2218
Email: vlinkov@uwc.ac.za
Funding Information
Equipment Price: 
R7,000,000
Year of Acquisition: 
2012