Carl Zeiss

The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging. The SEM uses a schottky type field emitter which enables it to produce clearer images even at low kV. The resolution of the equipment is 1.3 nm at 20 kV and 2.8 nm at 1 kV. The alignment of the beam may be done electronically. The instrument is easy to use even by a beginner as it includes focusing assistance using a wobbler with variable amplitude. One is able to rotate and tilt the sample stage. The included detectors are an in-lens detector, ET-SE detector and a VP SE G3 detector as well as a STEM detector.

The Zeiss LSM510 Meta Confocal Microscopy System comprises of an existing inverted motorized microscope with a confocal laser scanning module and an upgraded transmitted, epi-flourescent and live cell incubation system.

The JEOL-733 electron microprobe is an SEM, which is optimized for high accuracy in quantitative analysis by EDS and by wavelength dispersive spectroscopy (WDS). This probe is equipped with four WDS spectrometers and the Advanced Microbeam Analysis automation system featuring Probe for Windows software.

The LSM 510 Meta NLO is a high-end modular confocal system. In addition to being equipped with a laser module with multiple laser lines for excitation of the most commonly used fluorophores, it is capable of spectral fluorescence analysis (“spectral fingerprinting”) using a polychromatic detector.

The Inverted Confocal LSM 710 has the following features:

• Inverted Laser Scanning Microscope (LSM 710) with 34 spectral R/FL detection channels
• 6 laser lines 405,458,499,514,561 and 633nm
• Control electronics
• LSM ZEN 2008 software
• Laser Differential Interference Contrast (DIC) attachment for laser DIC and conventional DIC
• CO2 incubation chamber and heated, non motorized stage
• LCD condenser 0.55 H, Ph1, Ph2, Ph3, DIC
• DIC; 6 positions, eyepiece W-WL 10x/23
• Computer and Monitor