Equipment Filter

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu

Institution: 
University of the Witwatersrand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)Focussed Ion-Beam SEM (FIB-SEM)
Shimadzu SSX-550 EDX Scanning Electron Microscope (SEM) Electron Microscopes

Shimadzu SSX-550 EDX Scanning Electron Microscope (SEM) Electron Microscopes

The Super Scanning Electron Microscope SSX-550 EDX is a scanning electron microscope with an integral energy dispersive X-ray fluorescence spectrom

Institution: 
University of the Free State
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)

UNISA AFM-MFM Multimode System Atomic Force Microscope (AFM)

Atomic Force Microscopy (AFM) with multimode facility like magnetic force microscopy can be used for surface analysis, including magnetic imaging.

Institution: 
University of South Africa
MicroscopeAtomic Force Microscope (AFM)
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.

Institution: 
University of Zululand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope

Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope

The Dimension FastScan is a high speed multiple mode scanning probe microscope for morphological, phase, electrochemical and electrical characteris

Institution: 
Nelson Mandela Metropolitan University
Microscope
Field Emission Scanning Electron Microscope (FE-SEM)  with cathodoluminescene spectrometer JSM-7800F  Electron microscope

Field Emission Scanning Electron Microscope (FE-SEM) with cathodoluminescene spectrometer JSM-7800F Electron microscope

This is field emission gun scanning electron microscope fitted with Gatan monoCL for imaging and spectroscopy, and EDS for chemical composition ana

Institution: 
University of the Free State
Microscope
Electron nano-beam lithography JEBL-7001F Electron Microscopes

Electron nano-beam lithography JEBL-7001F Electron Microscopes

JEBL-7001F Electron Nano-beam Lithography with Four Nano Probe Electron Device Testing Station and Cantilever Probe Scanner at low Temperatures is

Institution: 
University of the Witwatersrand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)