UNISA AFM-MFM Multimode System Atomic Force Microscope (AFM)
Model:
AFM-MFM Multimode System
Manufacturer:
Supplier:
Atomic Force Microscopy (AFM) with multimode facility like magnetic force microscopy can be used for surface analysis, including magnetic imaging. The instrument can also be used for micro and nano scale lithography. For the AFM with diamond tips has been used to fabricate nano Josephson junctions. One can fabricate similar planar structures and devices on appropriate thin films.
Category:
Microscope - Atomic Force Microscope (AFM)
Disciplines:
Electrical Engineering, Material Science, Nanotechnology, Physics
Life Expectancy:
25years
Contact Person/s
Grantholder
Title: Prof
First Name: VS
Last Name: Vallabhapurapu
Phone: +27 12-429-8027
Email: vallavs@unisa.ac.za
First Name: VS
Last Name: Vallabhapurapu
Phone: +27 12-429-8027
Email: vallavs@unisa.ac.za