UNISA AFM-MFM Multimode System Atomic Force Microscope (AFM)

Model: 
AFM-MFM Multimode System
Make: 
Supplier: 

Atomic Force Microscopy (AFM) with multimode facility like magnetic force microscopy can be used for surface analysis, including magnetic imaging. The instrument can also be used for micro and nano scale lithography. For the AFM with diamond tips has been used to fabricate nano Josephson junctions. One can fabricate similar planar structures and devices on appropriate thin films.

Category: 
Microscope - Atomic Force Microscope (AFM)
Disciplines: 
Electrical Engineering, Material Science, Nanotechnology, Physics
Life Expectancy: 
25years
Location
Unisa - University of South Africa
Preller Street
Pretoria
0002

Contact Person/s

Name: Prof VS Vallabhapurapu
Phone: +27 12-429-8027
Email: vallavs@unisa.ac.za
Estimated Cost and Availability
Internal: 
R100
External: 
R300
Private Sector: 
R500

Grantholder

Title: Prof
First Name: VS
Last Name: Vallabhapurapu
Phone: +27 12-429-8027
Email: vallavs@unisa.ac.za
Funding Information
Year of Acquisition: 
2012