Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope

The Dimension FastScan is a high speed multiple mode scanning probe microscope for morphological, phase, electrochemical and electrical characterisation of solids, polymers and biological material on the nano-scale. It is the fastest SPM in the market, allowing the monitoring of dynamic processes on a time scale of seconds. The ultimate height resolution is less than a nanometer. It features an exceptional force control and high scan rates (as little as 1 sec per image frame). The FastScan offers over 30 modes of operation: Apart from standards nodes such as Tapping, Contact, Lift (including Magnetic and Electric Force modes), and phase imaging, the FastScan incorporates:

• ScanAsyst, allowing automated configuration of scan parameters enabling inexpirienced users to obtain high quality images without advanced training.
• Nanomechanical mapping provides quantitative analysis of e.g. elastic modulus, deformation, adhesion.
• Lateral force mode, which maps differences in frictional forces across the surface.
• The unique PeakForce tapping mode decreases sample and tip wear and enhances other SPM modes.
• Torsional Resonance mode provides information on in-plane anisotropy and dynamic friction.
• Surface Potential model (Kelvin Force probe microscopy) allows quantification of the surface Fermi-level of semiconductors.
• PeakForce Tunneling AFM mode (similar to conductive AFM, but with higher sensitivity)allows mapping of the conductivity of low to medium conducting and semiconducting materials (analysis of soft materials and loosely bound particles ike nanorods is also possible)
• Scanning Capacitance mode, which maps the majority carrier concentration in moderately to highly doped semiconductors.
• Electrochemical AFM allows nano-scale mapping of electrode surfaces.
• Photoconductive AFM, which allows the extraction of a variety of parameters from a semiconductor device, such as buried quantum dot distribution in a solar cell, localised defects, quantum efficiencies and approximate carrier motilities.
• STM mode provides information on the atomic scale, surface reconstruction and atomic step arrangements.