Equipment Filter

Zeiss EVO 15LS Variable Pressure Scanning Electron Microscope (VPSEM) Electron Microscopes

Zeiss EVO 15LS Variable Pressure Scanning Electron Microscope (VPSEM) Electron Microscopes

The Zeiss Evo 15LS  VPSEM is a Scanning Electron Microscope (SEM) with vacuum and extended pressure viewing capability.

Institution: 
University of KwaZulu-Natal
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)Variable Pressure SEM
Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes

Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes

The JSM-6390LV is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm.

Institution: 
University of Fort Hare
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.

Institution: 
University of Zululand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope

Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope

The Dimension FastScan is a high speed multiple mode scanning probe microscope for morphological, phase, electrochemical and electrical characteris

Institution: 
Nelson Mandela Metropolitan University
Microscope