The Zeiss Evo 15LS VPSEM is a Scanning Electron Microscope (SEM) with vacuum and extended pressure viewing capability. It is equipped with a Lanthanum Hexaboride gun for greater brightness, a quadropole backscatter detector and an extra monitor. The major accessory item is the Oxford X-ray microanalyser with a X-max 80mm high sensitivity detector. The instrument is able to perform examination and microanalysis on a very wide range of material whether that material is dry, damp or wet. Conventional preparation procedures such as dehydration and material coating are avoided in the examination of material using the low vacuum or extended pressure modes.
Microscope - Electron Microscopes - Scanning Electron Microscope (SEM) - Variable Pressure SEM