Zeiss

Zeiss Atomic Force Microscopy with electrochemical capabilities Electron microscope

An atomic force microscope is optimised for measuring surface features that are extremely small in the nanometer scale. AFM gives real space images with very high resolution, not only in vacuum or in air, but also in solutions, including electrolytes in the case of Electrochemical AFM. Electrochemical AFM allows for imaging of electrode surfaces in solution under electrochemical control. Thus, the topographic imaging of electrode surfaces can be performed.

Contact Person/s

Name: Prof Tebello Nyokong
Phone: +27 46-603-8260
Email: tnyokong@ru.ac.za

Grantholder

Title: Prof
First Name: Tebello
Last Name: Nyokong
Phone: +27 46-603-8260
Email: tnyokong@ru.ac.za
Zeiss Atomic Force Microscopy with electrochemical capabilities Electron microscope

Zeiss Zeiss AxioVert.A1 Inverted Fluorescence Microscope Fluorescent Microscopes

The compact Zeiss AxioVert.A1 Inverted Fluorescence Microscope represents the most recent innovation in inverted light microscopy by Zeiss. The microscope allows for viewing microscopic (5 - 10x magnification) samples most notably biological samples (e.g. whole mammalian cells in culture) using multiple contrasting methods including brightfield, phase contrast, traditional glass Differential Interference Contrast (DIC), plastic DIC (PlasDIC) and Improved Hoffman Modulation Contrast (iHMC) allows for visualisation of fine structural detail.

Contact Person/s

Name: Prof J Limson
Phone: +27 46-603-8263
Email: j.limson@ru.ac.za

Grantholder

Title: Prof
First Name: J
Last Name: Limson
Phone: +27 46-603-8263
Email: j.limson@ru.ac.za
Zeiss Zeiss AxioVert.A1 Inverted Fluorescence Microscope Fluorescent Microscopes

Zeiss Basic SPM System; AFM and STM with a Vibration Isolation Chamber, Potentiostat/Galvanostat

In the 1980's Binning & Rohrer, developed a technique from studying surface structures termed Scanning Tunneling Microscopy (STM). A whole range of related techniques have since been developed which are generally referred to as Scanning Probe Microscopy (SPM) techniques. Of these techniques, the most important is Atomic Force Microscopy (AFM). AFM utilises a sharp probe scanning over the surface of a sample. The probe in AFM is a tip on the end of a cantilever which bends in response to the force between the tip and the sample.

Contact Person/s

Name: Prof T Nyokong
Phone: +27 46-603-8260
Email: t.nyokong@ru.ac.za

Grantholder

Title: Prof
First Name: T
Last Name: Nyokong
Phone: +27 46-603-8260
Email: t.nyokong@ru.ac.za

Zeiss Axioskop Mot Plus Epifluorescent Microscope Optical Microscope

The Axioskop Mot Plus microscope combines a variety of excelent optical and technologically features. It offers a maximum economy for all standard applications in the life sciences, and its modular design permits tailored configurations to meet any specific requirement.

Contact Person/s

Name: Deshenthree Chetty
Phone: +27 11-709-4523
Email: Deshc@mintek.co.za
Zeiss Axioskop Mot Plus Epifluorescent Microscope Optical Microscope

Zeiss Cell Observer Live Imaging System, Axiovert 200M Complete System Inverted Motorised Microscope

The Cell Observer Live Imaging System (COLIS) is an inverted motorized microscope with cell culture facilities, a digital camera and integrated software for dynamic fluorescence imaging.

Contact Person/s

Name: Prof H Abrahamse
Phone: +27 11-559-6550
Email: habrahamse@uj.ac.za

Grantholder

Title: Prof
First Name: H
Last Name: Abrahamse
Phone: +27 11-559-6550
Email: habrahamse@uj.ac.za
Zeiss Cell Observer Live Imaging System, Axiovert 200M Complete System Inverted Motorised Microscope

Zeiss EVO 15LS Variable Pressure Scanning Electron Microscope (VPSEM) Electron Microscopes

The Zeiss Evo 15LS  VPSEM is a Scanning Electron Microscope (SEM) with vacuum and extended pressure viewing capability. It is equipped with a Lanthanum Hexaboride gun for greater brightness, a quadropole backscatter detector and an extra monitor. The major accessory item is the Oxford X-ray microanalyser with a X-max 80mm high sensitivity detector. The instrument is able to perform examination and microanalysis on a very wide range of material whether that material is dry, damp or wet.

Contact Person/s

Name: Prof SD Johnson
Phone: +27 33-260-5148
Email: Johnsonsd@ukzn.ac.za

Grantholder

Title: Prof
First Name: SD
Last Name: Johnson
Phone: +27 33-260-5148
Email: Johnsonsd@ukzn.ac.za
Zeiss EVO 15LS Variable Pressure Scanning Electron Microscope (VPSEM) Electron Microscopes

Zeiss Axiophot Fluorescent Light Microscope Fluorescent Microscopes

The Zeiss Axiophot is equipped with a 2 Megapixel Diagnostic Instruments RT KE Slider digital camera and Metavue software for image acquisition, processing and analysis. The camera can be used in a 12 bit monochrome mode for fast imaging of low light level fluorescence or a 24 bit color mode for acquisition of brightfield images where true color is required. In color mode the red green and blue images are acquired sequentially and then combined automatically, thereby avoiding the loss of resolution associated with mosaic chips.

Contact Person/s

Name: Rich Burgdorf
Phone: +27 33-260-6496
Email: burgdorfr@ukzn.ac.za
Zeiss Axiophot Fluorescent Light Microscope Fluorescent Microscopes