Equipment Filter

Philips CM200 Transmission Electron Microscope (TEM) Electron Microscopes

Philips CM200 Transmission Electron Microscope (TEM) Electron Microscopes

The Philips CM200 transmission electron microscope (TEM) operating at up to 200 kV is a very versatile microscope.

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)
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FEI Quanta 400 SEM Electron Microscopes

FEI Quanta 400 SEM Electron Microscopes

The FEI Quanta 400 FEG is the most versatile high resolution low-vacuum FEG SEM with extended low-vacuum capabilities for the really challenging sa

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
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FEI Nova 600 Nanolab Electron Microscopes

FEI Nova 600 Nanolab Electron Microscopes

The Nova 600 NanoLab brings new capabilities and flexibility to researchers and developers needing to create, modify, and characterize complex stru

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)›Focussed Ion-Beam SEM (FIB-SEM)
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FEI Tecnai G2 Spirit Transmission Electron Microscope (TEM) Electron Microscopes

FEI Tecnai G2 Spirit Transmission Electron Microscope (TEM) Electron Microscopes

The FEI Tecnai transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, ma

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)
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FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)›Focussed Ion-Beam SEM (FIB-SEM)
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Jeol JSM-840 SEM Electron Microscopes

Jeol JSM-840 SEM Electron Microscopes

The JEOL JSM-840 is a multi-purpose SEM capable of acceleration voltages up to 40kV.

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
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FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes

FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes

The FEI Spirit is a high brightness (LaB6 sourced) high magnification, high resolution, 120kV TEM that is equipped with an ultrathin windowed energ

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)
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Carl Zeiss Auriga Field Emission Scanning Electron Microscope (FEG SEM) Electron Microscopes

Carl Zeiss Auriga Field Emission Scanning Electron Microscope (FEG SEM) Electron Microscopes

The Auriga FEG SEM is a fully digital 30 kV Hi Resolution FEG SEM equipped with EDS and a range of secondary and backscattered detectors peculiar t

Institution: 
University of the Western Cape
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
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FEI Technai G2 F20 S-Twin MAT HRTEM Electron Microscopes

FEI Technai G2 F20 S-Twin MAT HRTEM Electron Microscopes

The instrument is a 200 kV FEG-TEM, with all the possible analytical facilities for full materials related analyses, equipped with scanning coils,

Institution: 
University of the Western Cape
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)›High Resolution TEM (HR-TEM)
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Princeton Applies Science and Uniscan 370 Princeton Applied Research Scanning Electrochemical Microscopy (SCEM) workstation Model TSTRM-12 Uniscan 12-Channel Robotic Electrochemical Sensor Testing Station Electron Microscopes

The Multi-Channel Scanning Electrochemical Workstation is a hyphenated instrumentation that consists of a Model 370 Princeton Applied Research (PAR

Institution: 
University of the Western Cape
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
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