Equipment Filter

Veeco diCP-II Scanning Probe Microscope Scanning Probe Microscopes

The Digital Instruments CP-II Scanning Probe Microscope (SPM) provides high performance and value for material and physical science research.

Institution: 
University of the Witwatersrand
MicroscopeScanning Probe Microscopes
Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

The Veeco TappingMode AFM operates by scanning a tip attached to the end of an oscillating cantilever across the sample surface.

Institution: 
University of the Witwatersrand
MicroscopeAtomic Force Microscope (AFM)
Veeco Dimension 3100 Scanning Probe Microscope Scanning Probe Microscopes

Veeco Dimension 3100 Scanning Probe Microscope Scanning Probe Microscopes

The Dimension 3100 AFM is an instrument capable of imaging specimens with a horizontal and vertical resolution down to a fraction of a nanometer.

Institution: 
University of the Witwatersrand
MicroscopeScanning Probe Microscopes
Veeco Nanoman V Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

Veeco Nanoman V Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

The major hardware components of the equipment are the scanner, with a closed (x-y) feed-back loop which provides optimum positioning accurac

Institution: 
iThemba LABS
MicroscopeAtomic Force Microscope (AFM)