Equipment Filter

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)›Focussed Ion-Beam SEM (FIB-SEM)
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Bruker D8 Advance/Discover XRD diffractometer X-ray Diffractometer (XRD)

Bruker D8 Advance/Discover XRD diffractometer X-ray Diffractometer (XRD)

An XRD facility optimised for the following measurements

Institution: 
University of the Witwatersrand
Diffractometers›X-ray Diffractometer (XRD)
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Jobin Yvon Heriba TX64000 Raman Spectrometer and Bruker Vertex 70 FTIR Spectrometer Raman Spectrometer

Jobin Yvon Heriba TX64000 Raman Spectrometer and Bruker Vertex 70 FTIR Spectrometer Raman Spectrometer

The TX64000 Raman Spectrometer and Bruker Vertex 70 FTIR Spectrometer is a triple grating spectrometer system with ultra high spectral resolution,

Institution: 
University of Pretoria
Spectrometers›Raman Spectrometer
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Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.

Institution: 
University of Zululand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
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Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope

Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope

The Dimension FastScan is a high speed multiple mode scanning probe microscope for morphological, phase, electrochemical and electrical characteris

Institution: 
Nelson Mandela Metropolitan University
Microscope
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Precision 3D Optical Profiler Talysurf PGI Dimension 5XL

Precision 3D Optical Profiler Talysurf PGI Dimension 5XL

The equipment is a 3D surface profiler capable of measuring surface forms and roughness with a resolution down to 0.2 nanometre.

Institution: 
Nelson Mandela Metropolitan University
Other
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Field Emission Scanning Electron Microscope (FE-SEM) with cathodoluminescene spectrometer JSM-7800F Electron microscope

Field Emission Scanning Electron Microscope (FE-SEM) with cathodoluminescene spectrometer JSM-7800F Electron microscope

This is field emission gun scanning electron microscope fitted with Gatan monoCL for imaging and spectroscopy, and EDS for chemical composition ana

Institution: 
University of the Free State
Microscope
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Bruker High Perfomance Digital FT-NMR 400 Avance III HD NanoBay Spectrometer & 500 Avance III HD NMR Spectrometer

Bruker High Perfomance Digital FT-NMR 400 Avance III HD NanoBay Spectrometer & 500 Avance III HD NMR Spectrometer

The spectrometers use nuclear magnetic resonance to provide information on the molecular and structural dynamics of biological, organic and inorgan

Institution: 
University of the Western Cape
Nuclear Magnetic Resonance Spectrometer (NMR)
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Electron nano-beam lithography JEBL-7001F Electron Microscopes

Electron nano-beam lithography JEBL-7001F Electron Microscopes

JEBL-7001F Electron Nano-beam Lithography with Four Nano Probe Electron Device Testing Station and Cantilever Probe Scanner at low Temperatures is

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
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Optosolar Large Area Solar Simulator Large Area Solar Simulator

The solar simulator comprises a pulsed xenon lamp that simulates the solar spectrum and is representative of the ASTM spectrum (AM1.5, class A) tha

Institution: 
Nelson Mandela Metropolitan University
Other›Large Area Solar Simulator
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