Equipment Filter
AJA International Sputter Coater Sputter Coater
The equipment can be used to deposit thin films on various substrates.
Bruker D8 Venture Diffractometer System with CMOS Photon 100 Detector and Silver and Molybdenum Sources X-ray Diffractometer (XRD)
Dual wavelength system with silver (Ag) and molybdenum (Mo) radiation:
FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes
The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu
Bruker D8 Advance/Discover XRD diffractometer X-ray Diffractometer (XRD)
An XRD facility optimised for the following measurements
Shimadzu SSX-550 EDX Scanning Electron Microscope (SEM) Electron Microscopes
The Super Scanning Electron Microscope SSX-550 EDX is a scanning electron microscope with an integral energy dispersive X-ray fluorescence spectrom
Jobin Yvon Heriba TX64000 Raman Spectrometer and Bruker Vertex 70 FTIR Spectrometer Raman Spectrometer
The TX64000 Raman Spectrometer and Bruker Vertex 70 FTIR Spectrometer is a triple grating spectrometer system with ultra high spectral resolution,
The Risø National Laboratory TL/OSL-DA-20 Luminescence Reader
The Risø TL/OSL-DA-20 Luminescence Reader is designed for automated measurement of thermally and optically stimulated luminescence.
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes
The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.
Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope
The Dimension FastScan is a high speed multiple mode scanning probe microscope for morphological, phase, electrochemical and electrical characteris
Field Emission Scanning Electron Microscope (FE-SEM) with cathodoluminescene spectrometer JSM-7800F Electron microscope
This is field emission gun scanning electron microscope fitted with Gatan monoCL for imaging and spectroscopy, and EDS for chemical composition ana