Equipment Filter

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu

Institution: 
University of the Witwatersrand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)Focussed Ion-Beam SEM (FIB-SEM)
FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes

FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes

The FEI Spirit is a high brightness (LaB6 sourced) high magnification, high resolution, 120kV TEM that is equipped with an ultrathin windowed energ

Institution: 
University of the Witwatersrand
MicroscopeElectron MicroscopesTransmission Electron Microscope (TEM)
FEI Technai G2 F20 S-Twin MAT HRTEM Electron Microscopes

FEI Technai G2 F20 S-Twin MAT HRTEM Electron Microscopes

The instrument is a 200 kV FEG-TEM, with all the possible analytical facilities for full materials related analyses, equipped with scanning coils,

Institution: 
University of the Western Cape
MicroscopeElectron MicroscopesTransmission Electron Microscope (TEM)High Resolution TEM (HR-TEM)
FEI Tecnai F20 Transmission Electron Microscope (TEM) Electron Microscopes

FEI Tecnai F20 Transmission Electron Microscope (TEM) Electron Microscopes

The FEI Tecnai F20 is a 200Kv Field Emission Gun (FEG) High Resolution Cryo-TEM.

Institution: 
University of Cape Town
MicroscopeElectron MicroscopesTransmission Electron Microscope (TEM)
FEI Nova Nano SEM200 High Resolution Scanning Electron Microscope (HR-SEM) Upgrades (Raith Lithography, EBSD and EDAX Systems)

FEI Nova Nano SEM200 High Resolution Scanning Electron Microscope (HR-SEM) Upgrades (Raith Lithography, EBSD and EDAX Systems)

The FEI Novaô Nano SEM provides for high-quality nanoscale research tools for a variety of applications that involve sample characterization, analy

Institution: 
Mintek
Microscope