Equipment Filter

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu

Institution: 
University of the Witwatersrand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)Focussed Ion-Beam SEM (FIB-SEM)
Jeol 840A Scanning Electron Microscope (SEM)

Jeol 840A Scanning Electron Microscope (SEM)

The JEOL 840A is a medium resol

Institution: 
Mintek
Microscope
Field Emission Gun Scanning Electron Microscope (FEG-SEM) QEMSCAN  Electron Microscopes

Field Emission Gun Scanning Electron Microscope (FEG-SEM) QEMSCAN Electron Microscopes

Automated mineralogy is an analytical tool which provides rapid, reproducible and statistically reliable quantitative information on minerals and c

Institution: 
University of Cape Town
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)