Equipment Filter

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu

Institution: 
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)›Focussed Ion-Beam SEM (FIB-SEM)
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Leco TC500 Nitrogen and Oxygen Analyser

Leco TC500 Nitrogen and Oxygen Analyser

The Leco TC500-Series offers quality, high-performance, and advanced technology that meet virtually any production needs for in metals, refractorie

Institution: 
Stellenbosch University
Other
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AutoLab Electrochemical Potentiostat PGSTAT 302N

AutoLab Electrochemical Potentiostat PGSTAT 302N

The 302N has a high end, high current 

Institution: 
Mintek
Other
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Cameca SX50 Electron Microprobe

Cameca SX50 Electron Microprobe

The Cameca SX-50 Electron Microprobe is equipped with four multi-crystal wavelength-dispersive spectrometers (WDS) and one energy-dispersive spectr

Institution: 
Mintek
Other
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FEI Helix Detector (HD) Gaseous Analytical Detector (GAD) and Electron Backscatter Diffraction Detector (EBDD)

The equipment consists of additional detectors for the Nova NanoSEM: Helix Detector.

Institution: 
Mintek
Detectors
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Vacutec Nanosys U: Vacutec E-Beam Evaporator Tumbling System Physical Vapour Desposition System

This a physical vapour deposition (PVD) coating system incorpo

Institution: 
Mintek
Other›Physical Vapour Desposition System
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NETZSCH GmbH Rhodium Furnace with Calorimetry Module for Simultaneous Thermal Analyser (STA) - Rhodium furnace Model 6.225.6-89

The Simultaneous Thermal Analysis system has a high temperature furnace capability of up to 1650o

Institution: 
Mintek
Thermal analysis system
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Jeol 840A Scanning Electron Microscope (SEM)

Jeol 840A Scanning Electron Microscope (SEM)

The JEOL 840A is a medium resol

Institution: 
Mintek
Microscope
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Field Emission Gun Scanning Electron Microscope (FEG-SEM) QEMSCAN Electron Microscopes

Field Emission Gun Scanning Electron Microscope (FEG-SEM) QEMSCAN Electron Microscopes

Automated mineralogy is an analytical tool which provides rapid, reproducible and statistically reliable quantitative information on minerals and c

Institution: 
University of Cape Town
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
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Gleeble 3500

Gleeble 3500

The Geeble 3500 is a computer controlled thermal and mechanical testing system.

Institution: 
University of the Witwatersrand
Other
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