Equipment Filter
Veeco AFM CP-II Atomic Force Microscope (AFM)
The AFM CP-II probes the surface of a material with a sharp tip, which is a few microns long and less than 10nm in diameter.
Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)
AFM measures the atomic level forces between a sharp probing tip attached to a cantilever spring and a sample surface.
Carl Zeiss 410 Laser Scanning Confocal Microscope (LSM) Laser Scanning Microscope (LSM)
The Zeiss LSM 410 invert is a modern incarnation of the confocal microscope.
Zeiss Axioskop 2 MDT Microscope Laser Scanning Microscope (LSM)
The Zeiss Axioskop 2 is easy to operate; the motorized version means another quantum leap in operating convenience.
Carl Zeiss Auriga Field Emission Scanning Electron Microscope (FEG SEM) Electron Microscopes
The Auriga FEG SEM is a fully digital 30 kV Hi Resolution FEG SEM equipped with EDS and a range of secondary and backscattered detectors peculiar t
Carl Zeiss Superresolution ELYRA S1 with SR-SIM and LSM 780 technology
The Supperresolution ELYRA S1 utilizes SR-SIM (Super resolution Structured Illumination Microscopy) technology to yield resolution of up to double
Carl Zeiss Auriga Cobra FIB Focused Ion Beam Scanning Electron Microscope (FIBSEM)
The Auriga Cobra FIB FESEM i
Carl Zeiss THMS 600 Polarised Optical Microscope
The Carl Zeiss Axiovisson
Carl Zeiss Epifluorescent Microscope Axiolab with AxioCam MRc and Carl Zeiss HBO 50 UV Lamp
Epifluorescence microscopy is a technique which is widely used by biologists.
Bruker Dimension Icon Scanning Probe Microscope (SPM) Scanning Probe Microscopes
The Dimension Icon SPM has modules that can map low-and mid-strength electrical currents, resistance and capacitance, with nano-scale resolution, o