Bruker Dimension Icon Scanning Probe Microscope (SPM) Scanning Probe Microscopes
Model:
Dimension Icon Scanning Probe Microscope (SPM)
Manufacturer:
Supplier:
The Dimension Icon SPM has modules that can map low-and mid-strength electrical currents, resistance and capacitance, with nano-scale resolution, on a wide variety of materials. It performs all the major SPM techniques to measure surface characteristics for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200 mm in diameter.
Category:
Microscope - Scanning Probe Microscopes
Disciplines:
Solid State Physics