Bruker Dimension Icon Scanning Probe Microscope (SPM) Scanning Probe Microscopes

Model: 
Dimension Icon Scanning Probe Microscope (SPM)
Make: 
Supplier: 

The Dimension Icon SPM has modules that can map low-and mid-strength electrical currents, resistance and capacitance, with nano-scale resolution, on a wide variety of materials. It performs all the major SPM techniques to measure surface characteristics for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200 mm in diameter.

Category: 
Microscope - Scanning Probe Microscopes
Disciplines: 
Solid State Physics
Location
Department: 
Physics
University of Pretoria
Lynwood Road
Pretoria
0002

Contact Person/s

Name: Prof FD Auret
Phone: +27 12-420-2684
Email: danie.auret@up.ac.za

Grantholder

Title: Prof
First Name: FD
Last Name: Auret
Phone: +27 12-420-2684
Email: danie.auret@up.ac.za