Equipment Filter
Bruker D8 Venture Diffractometer System with CMOS Photon 100 Detector and Silver and Molybdenum Sources X-ray Diffractometer (XRD)
Dual wavelength system with silver (Ag) and molybdenum (Mo) radiation:
Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)
AFM measures the atomic level forces between a sharp probing tip attached to a cantilever spring and a sample surface.
Maccor 4300 Electrochemical Test System
The Maccor Battery Test System Model 4300 for electrochemical cycling (testing) of battery cells has 8 channels each with 4 different current range
Bruker D8 Advance/Discover XRD diffractometer X-ray Diffractometer (XRD)
An XRD facility optimised for the following measurements
FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes
The FEI Spirit is a high brightness (LaB6 sourced) high magnification, high resolution, 120kV TEM that is equipped with an ultrathin windowed energ
Carl Zeiss Auriga Field Emission Scanning Electron Microscope (FEG SEM) Electron Microscopes
The Auriga FEG SEM is a fully digital 30 kV Hi Resolution FEG SEM equipped with EDS and a range of secondary and backscattered detectors peculiar t
FEI Technai G2 F20 S-Twin MAT HRTEM Electron Microscopes
The instrument is a 200 kV FEG-TEM, with all the possible analytical facilities for full materials related analyses, equipped with scanning coils,
Resonetics M-50-LR Excimer Laser Ablation System Laser Ablation system
The Resonetics M-50-LR is a next generation Excimer laser ablation (Excimer-LA) system for in-situ U/Pb and trace element microanalysis of geomater
Bruker D8 Discover with GADDS - Modular X-Ray Diffraction System X-ray Diffractometer (XRD)
The D8 DISCOVER with GADDS combines cutting edge x-ray technology of the highest quality
Micromeritics ASAP 2020 Surface Area and Pore Analysis
Surface area and porosity are two important physical properties that determine the quality and utility of many materials.