Equipment Filter
FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes
The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu
Shimadzu SSX-550 EDX Scanning Electron Microscope (SEM) Electron Microscopes
The Super Scanning Electron Microscope SSX-550 EDX is a scanning electron microscope with an integral energy dispersive X-ray fluorescence spectrom
UNISA AFM-MFM Multimode System Atomic Force Microscope (AFM)
Atomic Force Microscopy (AFM) with multimode facility like magnetic force microscopy can be used for surface analysis, including magnetic imaging.
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes
The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.
Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope
The Dimension FastScan is a high speed multiple mode scanning probe microscope for morphological, phase, electrochemical and electrical characteris
Field Emission Scanning Electron Microscope (FE-SEM) with cathodoluminescene spectrometer JSM-7800F Electron microscope
This is field emission gun scanning electron microscope fitted with Gatan monoCL for imaging and spectroscopy, and EDS for chemical composition ana
Electron nano-beam lithography JEBL-7001F Electron Microscopes
JEBL-7001F Electron Nano-beam Lithography with Four Nano Probe Electron Device Testing Station and Cantilever Probe Scanner at low Temperatures is