Equipment Filter
FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes
The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu
Shimadzu SSX-550 EDX Scanning Electron Microscope (SEM) Electron Microscopes
The Super Scanning Electron Microscope SSX-550 EDX is a scanning electron microscope with an integral energy dispersive X-ray fluorescence spectrom
Leica DM 2500 M Optical Microscope
The Leica DM 2500 M is designed for material analysis and quality control.
Carl Zeiss Axio Observer Z1RP Inverted Microscope
The Inverted Confocal LSM 710 has the following features:
Carl Zeiss Ultra Plus Field emission Scanning Electron Microscope (FEGSEM) Electron Microscopes
20 nA FEGSEM with: airlock, STEM, Oxford EDS/EBSD, Quorum Cryo system, charge compensator, plasma cleaner.
Jeol 1210 Electron Microscope Electron Microscopes
The JEOL 1210 is a conventional transmission electron microscope which is optimized for high contrast imaging at low to moderate magnifications (&l
Zeiss Zeiss AxioVert.A1 Inverted Fluorescence Microscope Fluorescent Microscopes
The compact Zeiss AxioVert.A1 Inverted Fluorescence Microscope represents the most recent innovation in inverted light microscopy by Zeiss.
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes
The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.
Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope
The Dimension FastScan is a high speed multiple mode scanning probe microscope for morphological, phase, electrochemical and electrical characteris
Field Emission Scanning Electron Microscope (FE-SEM) with cathodoluminescene spectrometer JSM-7800F Electron microscope
This is field emission gun scanning electron microscope fitted with Gatan monoCL for imaging and spectroscopy, and EDS for chemical composition ana