Equipment Filter
Bruker Dimension Icon Scanning Probe Microscope (SPM) Scanning Probe Microscopes
The Dimension Icon SPM has modules that can map low-and mid-strength electrical currents, resistance and capacitance, with nano-scale resolution, o
Institution:
University of Pretoria
Microscope›Scanning Probe Microscopes
Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope
JEOL ARM200F double aberration corrected
Institution:
Nelson Mandela Metropolitan University
Microscope
Jeol CP II Cross Section Polisher
The Cross Section Polisher uses an Argon Ion Beam to prepare cross sections of materials for characterization by Scanning Electron Microscopy
Institution:
Nelson Mandela Metropolitan University
Other
Bruker 80 V FTIR and Raman with Closed Cycle Helium Cryostat Fourier Transform Infrared Spectrometer (FTIR)
The Bruker 80 V FTIR/Raman sy
Institution:
Nelson Mandela Metropolitan University
Spectrometers›Fourier Transform Infrared Spectrometer (FTIR)
Gatan Inc. Quantum Imaging Filter and Tomography System - GIF Quantum
The Gatan Image Filter (GIF) is mounted below the TEM camera ch
Institution:
Nelson Mandela Metropolitan University
Other
Philips CM20 Transmission Electron Microscope (TEM)
The Philips CM20 is an analytical TEM, with a tungsten electron gun, which can be operated between 20 and 200kV.
Institution:
Nelson Mandela Metropolitan University
Microscope
Philips EM 420 Transmission Electron Microscope (TEM)
The Philips EM420 is a standard TEM with a lattice resolution of 0.3nm, and operates at a maximun accelerating voltage of 120 kV.
Institution:
Nelson Mandela Metropolitan University
Microscope