Equipment Filter
Veeco AFM CP-II Atomic Force Microscope (AFM)
The AFM CP-II probes the surface of a material with a sharp tip, which is a few microns long and less than 10nm in diameter.
Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)
AFM measures the atomic level forces between a sharp probing tip attached to a cantilever spring and a sample surface.
Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)
The Veeco TappingMode AFM operates by scanning a tip attached to the end of an oscillating cantilever across the sample surface.
Bruker Atomic Force Microscope Atomic Force Microscope (AFM)
Atomic force microscopy utilizes the combination of an advanced scanning probe microscope, sophisticated software, and a specific mode or tec
Veeco Nanoman V Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)
The major hardware components of the equipment are the scanner, with a closed (x-y) feed-back loop which provides optimum positioning accurac
UNISA AFM-MFM Multimode System Atomic Force Microscope (AFM)
Atomic Force Microscopy (AFM) with multimode facility like magnetic force microscopy can be used for surface analysis, including magnetic imaging.