Equipment Filter

Bruker D8 Venture Diffractometer System with CMOS Photon 100 Detector and Silver and Molybdenum Sources X-ray Diffractometer (XRD)

Bruker D8 Venture Diffractometer System with CMOS Photon 100 Detector and Silver and Molybdenum Sources X-ray Diffractometer (XRD)

Dual wavelength system with silver (Ag) and molybdenum (Mo) radiation:

Institution: 
University of the Witwatersrand
DiffractometersX-ray Diffractometer (XRD)
Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

AFM measures the atomic level forces between a sharp probing tip attached to a cantilever spring and a sample surface.

Institution: 
University of the Witwatersrand
MicroscopeAtomic Force Microscope (AFM)
Maccor 4300 Electrochemical Test System

Maccor 4300 Electrochemical Test System

The Maccor Battery Test System Model 4300 for electrochemical cycling (testing) of battery cells has 8 channels each with 4 different current range

Institution: 
University of the Witwatersrand
Other
Bruker D8 Advance/Discover XRD diffractometer  X-ray Diffractometer (XRD)

Bruker D8 Advance/Discover XRD diffractometer X-ray Diffractometer (XRD)

An XRD facility optimised for the following measurements

Institution: 
University of the Witwatersrand
DiffractometersX-ray Diffractometer (XRD)
FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes

FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes

The FEI Spirit is a high brightness (LaB6 sourced) high magnification, high resolution, 120kV TEM that is equipped with an ultrathin windowed energ

Institution: 
University of the Witwatersrand
MicroscopeElectron MicroscopesTransmission Electron Microscope (TEM)