Equipment Filter
Bruker Atomic Force Microscope Atomic Force Microscope (AFM)
Atomic force microscopy utilizes the combination of an advanced scanning probe microscope, sophisticated software, and a specific mode or tec
Institution:
Council for Scientific and Industrial Research (CSIR)
Microscope›Atomic Force Microscope (AFM)
Jeol JEM 1200EXII Electron Microscopes
A JEOL JEM 1200 EXII allows users to perform conventional TEM with thin-sectioned specimens, X-ray microanalysis, and other transmission electron m
Institution:
Stellenbosch University
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)
Widefield High-content Analysis System ImageXpress Micro XLS
Institution:
Nelson Mandela Metropolitan University
Microscope