Equipment Filter

Leica DM 2500 M Optical Microscope

Leica DM 2500 M Optical Microscope

The Leica DM 2500 M is designed for material analysis and quality control.

Institution: 
University of Pretoria
Microscope
Carl Zeiss Ultra Plus Field emission Scanning Electron Microscope (FEGSEM) Electron Microscopes

Carl Zeiss Ultra Plus Field emission Scanning Electron Microscope (FEGSEM) Electron Microscopes

20 nA FEGSEM with: airlock, STEM, Oxford EDS/EBSD, Quorum Cryo system, charge compensator, plasma cleaner.

Institution: 
University of KwaZulu-Natal
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
FEI Nova Nano SEM200 High Resolution Scanning Electron Microscope (HR-SEM) Upgrades (Raith Lithography, EBSD and EDAX Systems)

FEI Nova Nano SEM200 High Resolution Scanning Electron Microscope (HR-SEM) Upgrades (Raith Lithography, EBSD and EDAX Systems)

The FEI Novaô Nano SEM provides for high-quality nanoscale research tools for a variety of applications that involve sample characterization, analy

Institution: 
Mintek
Microscope
Jeol JSM 7600F Field Emission Gun Ultra-High Resolution Scanning Electron Microscope Electron Microscopes

Jeol JSM 7600F Field Emission Gun Ultra-High Resolution Scanning Electron Microscope Electron Microscopes

The JSM-7600F is a state of-the-art thermal field emission gun scanning electron microscope.

Institution: 
Tshwane University of Technology
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)