Equipment Filter
UNISA AFM-MFM Multimode System Atomic Force Microscope (AFM)
Atomic Force Microscopy (AFM) with multimode facility like magnetic force microscopy can be used for surface analysis, including magnetic imaging.
Institution:
University of South Africa
Microscope›Atomic Force Microscope (AFM)
Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope
JEOL ARM200F double aberration corrected
Institution:
Nelson Mandela Metropolitan University
Microscope